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Highlights from the Premium Archive

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Watch Brian Nakai and Jeffery Finder's (NXP Semiconductors) Best Presentation award winning presentation from the BiTS 2017 Automotive & mm-wave applications.   See more in the Premium Archive.

TestConX is the preeminent event  for test consumables, test cell integration, and test operations.

The program scope has expanded over its tweny-year history from packaged semiconductor functional /  “final” test and burn-in to encompass all practical aspects of electronics testing including validation, advanced packaging testing, system level test, module test, and beyond to finished product test.

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